A Systematic Approach to Reduce Wirebond defects caused by Tight Wire Loop Profile on Ball Grid Array Packages

Beltran, Irish and Ramiro, Mark Anthony and Dinglasan, Jerome (2022) A Systematic Approach to Reduce Wirebond defects caused by Tight Wire Loop Profile on Ball Grid Array Packages. Journal of Engineering Research and Reports, 22 (2). pp. 27-34. ISSN 2582-2926

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Abstract

Wirebond quality aspects on a semiconductor manufacturing is one of the key factors to be considered in having a robust product. Certain criteria are defined, met, and affects the output on the product. Other variables from downstream process are also taken in account to affect the response, specific die position or placement on die attach is one example. Without controlling this input factor, unwanted out of specification response will occur and may result to rejections on the next process. This paper will focus on how to address the wire tight loop on wire bond process by analyzing the problem through systematic approach using statistical tools improving the current performance of die placement on BGA products.

Item Type: Article
Subjects: Science Global Plos > Engineering
Depositing User: Unnamed user with email support@science.globalplos.com
Date Deposited: 15 Mar 2023 12:55
Last Modified: 27 Feb 2024 04:34
URI: http://ebooks.manu2sent.com/id/eprint/348

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